Plasma-induced defect engineering: Boosted the reverse water gas shift reaction performance with electron trap

Jinman Yang,Xingwang Zhu,Qing Yu,Guli Zhou,Qidi Li,Chongtai Wang,Yingjie Hua,Yuanbin She,Hui Xu,Huaming Li
DOI: https://doi.org/10.1016/j.jcis.2020.07.032
IF: 9.9
2020-11-01
Journal of Colloid and Interface Science
Abstract:<p>The reverse water gas shift reaction is a promising approach to solve the problem of CO<sub>2</sub> excessive emission and energy shortage. However, insufficient charge separation efficiency of numerous semiconductor photocatalysts hamper their CO<sub>2</sub> photoreduction performance. Defect engineering is considered as a desired method to tackle to solve that shortcoming by the boosting the electron capture process. Herein, the sulfur vacancies-rich CdIn<sub>2</sub>S<sub>4</sub> (V<sub>S</sub>-CdIn<sub>2</sub>S<sub>4</sub>) was synthesized by an efficient low-temperature plasma-enhanced technology. The outstanding V<sub>S</sub>-CdIn<sub>2</sub>S<sub>4</sub> shows a more excellent CO formation rate of 103.6 μmol g<sup>-1</sup> h<sup>-1</sup> comparing that of traditional CdIn<sub>2</sub>S<sub>4</sub> (31.36 μmol g<sup>-1</sup> h<sup>-1</sup>). The density function theory (DFT) calculation reveals the sulfur vacancy is the center of electron capture. Moreover, the formed defect level after introduce of surface vacancy effectively optimizes the light absorption. Thus, the enhanced photocatalytic CO<sub>2</sub> reduction performance can be attributed to the double improvement of light absorption and carrier separation. This work provides a novel and facile strategy to mediate carriers' movement behavior <em>via</em> defect engineering for high-efficient CO<sub>2</sub> photoreduction.</p>
chemistry, physical
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