Nonlinear Measures for Characterizing Rough Surface Morphologies

J. Kondev,C.L. Henley,D.G. Salinas

DOI: https://doi.org/10.1103/PhysRevE.61.104

1999-07-16

Abstract:We develop a new approach to characterizing the morphology of rough surfaces based on the analysis of the scaling properties of contour loops, i.e. loops of constant height. Given a height profile of the surface we perform independent measurements of the fractal dimension of contour loops, and the exponent that characterizes their size distribution. Scaling formulas are derived and used to relate these two geometrical exponents to the roughness exponent of a self-affine surface, thus providing independent measurements of this important quantity. Furthermore, we define the scale dependent curvature and demonstrate that by measuring its third moment departures of the height fluctuations from Gaussian behavior can be ascertained. These nonlinear measures are used to characterize the morphology of computer generated Gaussian rough surfaces, surfaces obtained in numerical simulations of a simple growth model, and surfaces observed by scanning-tunneling-microscopes. For experimentally realized surfaces the self-affine scaling is cut off by a correlation length, and we generalize our theory of contour loops to take this into account.

Materials Science,Statistical Mechanics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to characterize the morphology of rough surfaces by analyzing the scaling properties of rough surface contour lines. Specifically, the author has developed a new method to characterize the morphology of rough surfaces based on the scaling characteristics of contour lines (i.e., closed curves of constant height). This method mainly focuses on the following aspects:

1. **Fractal dimension of contour lines**: By independently measuring the fractal dimension of contour lines and combining it with the exponent that describes their size distribution, the author has derived relevant scaling formulas. These formulas can link these two geometric exponents to the roughness exponent of self - affine surfaces, thus providing an independent measurement of this important quantity.

2. **Scale - dependent curvature**: The author has defined scale - dependent curvature and determined whether height fluctuations deviate from Gaussian behavior by measuring its third - order moment. This is a non - linear measurement method that can more comprehensively characterize the morphological features of the surface.

3. **Application of non - linear measurements**: These non - linear measurement methods are used to characterize computer - generated Gaussian rough surfaces, the numerical simulation results of simple growth models, and surfaces observed by scanning tunneling microscopy. For the surfaces realized in the experiment, self - affine scaling will be truncated at a certain correlation length. Therefore, the author has also extended the contour line theory to take this factor into account.

In summary, the main purpose of this paper is to develop a new and more comprehensive method to characterize the morphology of rough surfaces, especially to identify significant differences between different surface models through non - linear measurement methods, even if these models have similar spatial power spectra. This helps to compare experimental observations and theoretical models more systematically, thereby better understanding the surface morphological features in non - equilibrium growth processes.