Measurements with a noninvasive detector and dephasing mechanism

S.A. Gurvitz
DOI: https://doi.org/10.1103/PhysRevB.56.15215
1997-10-05
Abstract:We study dynamics of the measurement process in quantum dot systems, where a particular state out of coherent superposition is observed. The ballistic point-contact placed near one of the dots is taken as a noninvasive detector. We demonstrate that the measurement process is fully described by the Bloch-type equations applied to the whole system. These equations clearly reproduce the collapse of the density-matrix into the statistical mixture in the course of the measurement process. The corresponding dephasing width is uniquely defined. We show that the continuous observation of one of the states in a coherent superposition may accelerate decay from this state -- in contradiction with rapidly repeated observations, which slow down the transitions between quantum states (the quantum Zeno effect).
Mesoscale and Nanoscale Physics,Quantum Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the decoherence mechanism in the measurement process in the quantum - dot system. Specifically, the author studied the decoherence phenomenon caused by measuring the occupation state of a certain quantum dot in a multi - quantum - dot system. To achieve this goal, the author introduced a non - invasive detector - ballistic point - contact, and explored how this detector affects the coherence of the system. ### Main problems: 1. **Decoherence mechanism**: The author attempted to understand how decoherence occurs when a certain state is continuously measured in the quantum - dot system. Decoherence refers to the process in which a quantum system changes from a pure state to a mixed state, which will lead to the disappearance of quantum coherence effects. 2. **Influence of non - invasive measurement**: The author used ballistic point - contact as a detector to study the influence of this non - invasive measurement on the quantum - dot system. In particular, the author focused on whether this measurement would accelerate the decay of the system from a certain state and its relationship with the Quantum Zeno Effect. 3. **Difference between continuous measurement and rapid repeated measurement**: The author explored the difference between continuous measurement and rapid repeated measurement. Although both involve frequent observations of the system, their effects on the system are completely different. Continuous measurement may lead to the delocalization of the system, while rapid repeated measurement will lead to the localization of the system. ### Specific problems: - **Determination of decoherence rate**: The author attempted to describe the evolution of the entire system through the Bloch - type equation and derive the decoherence rate from it. The decoherence rate determines the exponential decay rate of the off - diagonal density matrix elements. - **Influence of measurement on current**: The author also studied the influence of the measurement process on the direct current passing through the coupled quantum - dot system. In particular, how the behavior of the current changes under different decoherence rates. ### Summary: The core problem of this paper is to reveal the decoherence mechanism caused by non - invasive measurement in the quantum - dot system through theoretical analysis and model construction, and explain why continuous measurement will lead to the opposite effect compared to rapid repeated measurement. By introducing the ballistic point - contact detector, the author studied in detail the evolution of the density matrix during the measurement process, thus providing a new perspective for understanding the decoherence phenomenon in quantum measurement. ### Related formulas: - The expression for the decoherence rate \(\Gamma_d\) is: \[ \Gamma_d = (\sqrt{D}-\sqrt{D'})^2 = (\sqrt{T}-\sqrt{T'})^2\frac{V_d}{2\pi} \] where \(D\) and \(D'\) are the transition rates of the detector reservoirs from left to right respectively, \(T\) and \(T'\) are the penetration coefficients of the point contacts, and \(V_d\) is the voltage bias. - The decoherence term in the Bloch - type equation: \[ \dot{\sigma}_{ab}=i\epsilon\sigma_{ab}+i\Omega_0(\sigma_{aa}-\sigma_{bb})-\frac{1}{2}(\sqrt{D}-\sqrt{D'})^2\sigma_{ab} \] These formulas help the author quantitatively describe the decoherence process and its influence on the system behavior.