Abstract:Due to the need for higher reliability and performance from RF circuits, multi-port reflectometers are increasingly used as low-overhead impedance monitors. In this work, using periodic structures as multi-ports is proposed. Periodic structures impose a new constraint on the multi-port theory and simplify it significantly. This simplification leads to closed form solution for calibration and measurement procedures. The closed-form solution also shows that any arbitrary periodic structure will always have a unique solution for both procedures. Therefore, the proposed technique does not rely on frequency-dependent behavior of devices, such as directivity and phase shift to measure impedance. This fact leads to increased bandwidth and simplified design procedure. In addition, proposed multi-port structures can be calibrated by using fewer known loads than existing multi-port techniques. This fact, coupled with the closed-form solution, reduces computation overhead and test time. The theory and its robustness against non-idealities, such as part-to-part variation, are verified with Monte-Carlo simulations. A practical embodiment of the technique is demonstrated with EM simulations and hardware experiments. In this embodiment, the multi-port structure is embedded into an LC matching network. Hardware experiments show that the embedded multi-port structure can measure test loads with high accuracy from 1.5 GHz to 3.5 GHz, without degrading matching network performance.

Determining scattering matrix of a three-port reciprocal network from one-port measurements

Analyzing the experiment strategy of testing the equivalent parameters of a one-port network based on triangular voltage measurement method

Impedance Measurement Techniques for One-Port and Two-Port Networks

Generalized Short Circuit Ratio Calculation Based on Thevenin Equivalent Parameters Identified through Transient Simulation

Generalized Linear Network Analysis Method Based on the Transfer Scattering Approach

A General Equivalent Circuit for Lossy Non-Symmetric Reciprocal Two-Ports

Indirect Measurement of Switch Terms of a Vector Network Analyzer with Reciprocal Devices

Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters

PCB Electromagnetic Interference Modelling Based on Reciprocity Theorem

A NOVEL COUPLED T-MATRIX AND MICROWAVE NETWORK APPROACH FOR MULTIPLE SCATTERING FROM PARALLEL SEMICIRCULAR CHANNELS WITH ECCENTRIC CYLINDRICAL INCLUSIONS

Review of Near-Field EMI Measurement

Virtual VNA: Minimal-Ambiguity Scattering Matrix Estimation with Load-Tunable Ports

A Direct Method for Charge Collection Probability Computation Using the Reciprocity Theorem

A Miniature Multi-Component Probe for Near-Field Scanning

A Two-Port Measurement With Mechanically Robust Handhold Probes for Ultra Low PDN Impedance

Calculation of the Transient Reflection from A Two-Port Network with A Nonlinear Resistor Load

Virtual VNA 2.0: Ambiguity-Free Scattering Matrix Estimation by Terminating Inaccessible Ports With Tunable and Coupled Loads

Low Overhead RF Impedance Measurement by Using Periodic Structures

Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

A Novel Two-port Model for Interconnect Lines Driving Arbitrary Loads

A three-probe method for accurate nanoscale thermal transport measurements