Frequency, Intensity, and Phase Synchronous Imaging of Microwave With Nitrogen-Vacancy Center Microscopy

Hao Zhang,Zhonghao Li,Chenyu Yang,Renchao Chai,Zongmin Ma,Hao Guo,Huanfei Wen,Xin Li,Jun Tang,Jun Liu
DOI: https://doi.org/10.1109/tim.2024.3480213
IF: 5.6
2024-10-29
IEEE Transactions on Instrumentation and Measurement
Abstract:Microwave devices are indispensable components in modern communication. To address the challenge of synchronously visualizing multiple information components of microwave, a microwave near-field microscope based on the diamond nitrogen-vacancy (NV) color center has been developed. This microscope enables high-precision imaging of microwave field frequency, intensity, and phase information over a wide field of view ( m, with the theoretical limit resolution of m). Initially, leveraging the NV color center "mixer" enables synchronization in detecting microwave frequency, intensity, and phase information. Building upon this and combining with wide-field imaging technology, we achieve precise imaging of microwave frequency, intensity, and phase over a wide field of view on the microwave chip surface. Ultimately, through comparison between measurement and simulation results under different intensity and frequency conditions, the accuracy of our work is verified. This work achieves the frequency accuracy on the order of hertz, the microwave intensity sensitivity of T/ Hz, and the phase resolution uncertainty of less than 2.8°. These results offer important technical support for key aspects, such as quality monitoring, fault localization, and security assessment in microwave chip technologies.
engineering, electrical & electronic,instruments & instrumentation
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