Improved diffusion mapping combined with procrustes analysis for capturing local-global data structures in industrial process monitoring

Lingling Tong,Zhimin Lv
DOI: https://doi.org/10.1016/j.jtice.2024.105747
IF: 5.477
2024-09-03
Journal of the Taiwan Institute of Chemical Engineers
Abstract:Highlights • A process monitoring method based on local-global structures has been introduced. • The IDM-P method efficiently extracts features, greatly boosting fault detection rates. • The online application of a nonlinear dimensionality reduction method has been implemented. • The proposed approach has been validated on the TE process and steel industrial instances. Background Process monitoring, by providing early warnings of abnormal operating states resulting from process faults, facilitates the maintenance of normal production and ensures process safety. In the domain of industrial process monitoring, capturing the local-global structural features of data and acquiring an explicit mapping relationship for dimensionality reduction projection holds significant importance for online fault detection in industrial processes. Methods This study introduces an Improved Diffusion Mapping and Procrustes analysis (IDM-P) method for this purpose. Initially, considering the multiscale and correlation among industrial data features, the Mahalanobis distance is incorporated to improve the diffusion mapping algorithm. Utilizing this method allows for the concurrent capture of both local and global data structures, leading to a more efficient extraction of data-representative features, which enhances the accuracy of fault detection. Procrustes analysis is then used to obtain an explicit mapping matrix between high-dimensional data and low-dimensional manifolds, improving the efficiency of the key feature extraction of the new samples. Finally, this matrix is utilized to construct process monitoring statistics for fault detection. Significant Findings The method's effectiveness was validated through experiments on the TEP dataset and actual industrial data, demonstrating that IDM-P maintains higher accuracy and achieves optimal fault detection compared to other methods. Graphical abstract Download: Download high-res image (322KB) Download: Download full-size image
engineering, chemical
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