Abstract:A femtosecond electron‐based versatile microscopy that combines scanning ultrafast electron microscopy imaging and time‐resolved cathodoluminescence detection allows for directly visualizing and decoupling complex carrier dynamics involved in surface and bulk of semiconductors with unprecedented spatiotemporal and energetic resolutions. Carrier dynamics detection in different dimensions (space, time, and energy) with high resolutions plays a pivotal role in the development of modern semiconductor devices, especially in low‐dimensional, high‐speed, and ultrasensitive devices. Here, a femtosecond electron‐based versatile microscopy is reported that combines scanning ultrafast electron microscopy (SUEM) imaging and time‐resolved cathodoluminescence (TRCL) detection, which allows for visualizing and decoupling different dynamic processes of carriers involved in surface and bulk in semiconductors with unprecedented spatiotemporal and energetic resolutions. The achieved spatial resolution is better than 10 nm, and the temporal resolutions for SUEM imaging and TRCL detection are ≈500 fs and ≈4.5 ps, respectively, representing state‐of‐the‐art performance. To demonstrate its unique capability, the surface and bulk carrier dynamics involved in n‐type gallium arsenide (GaAs) are directly tracked and distinguished. It is revealed, in real time and space, that hot carrier cooling, defect trapping, and interband‐/defect‐assisted radiative recombination in the energy domain result in ordinal super‐diffusion, localization, and sub‐diffusion of carriers at the surface, elucidating the crucial role of surface states on carrier dynamics. The study not only gives a comprehensive physical picture of carrier dynamics in GaAs, but also provides a powerful platform for exploring complex carrier dynamics in semiconductors for promoting their device performance.

Decrypting Material Performance by Wide-field Femtosecond Interferometric Imaging of Energy Carrier Evolution

Use of Photoelectron Energy Spectrum Transfer Equation for the Measurement of a Narrowband XUV Pulse

Ultrafast Dynamic Microscopy of Carrier and Exciton Transport.

Direct Nanosecond Multiframe Imaging of Irreversible Dynamics in 4D Electron Microscopy

Femtosecond near-field scanning optical microscopy

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Femtosecond mega-electron-volt electron microdiffraction

Visualizing ultrafast photothermal dynamics with decoupled optical force nanoscopy

Ultrafast dynamics observation during femtosecond laser-material interaction

Imaging ultrafast carrier transport in nanoscale devices using femtosecond photocurrent microscopy

Single-frame measurement of the complete spatiotemporal field of ultrafast laser pulses using Carrier Frequency-Division Multiplexing Spectral Interferometry

High-resolution single-shot ultrafast imaging at ten trillion frames per second

Ultrafast Photoelectron Imaging with High Spatiotemporal and Energy Resolution

Coherently amplified ultrafast imaging using a free-electron interferometer

Ultrafast nanofemto photoemission electron microscopy of vectorial plasmonic fields

Self-Heterodyne Diffractive Imaging of Ultrafast Electron Dynamics Monitored by Single-Electron Pulses

Ultrafast optical nanoscopy of carrier dynamics in silicon nanowires

Femtosecond time-resolved spectroscopic photoemission electron microscopy for probing ultrafast carrier dynamics in heterojunctions

Solution-phase single-particle spectroscopy for probing multi-polaronic dynamics in quantum emitters at femtosecond resolution

A Femtosecond Electron‐Based Versatile Microscopy for Visualizing Carrier Dynamics in Semiconductors Across Spatiotemporal and Energetic Domains

Unraveling photodissociation dynamics by sub-femtosecond ultraviolet pulses: Insights into fragmental kinetics and carrier-envelope phase characterization