TMNIO:Triplet merged network with involution operators for improved few‐shot image classification
Qi Lulu,Xu Ranhui,Zhao Shaojie,Zheng Mingming,Yu Weiqin
DOI: https://doi.org/10.1049/ipr2.13055
IF: 2.3
2024-02-22
IET Image Processing
Abstract:Triplet merged network with involution operators (TMNIO) is a novel method that addresses the challenges of poor fitting and insufficient generalization in few‐shot learning. It utilizes dual encoders and involution operators to enhance feature extraction. The two‐stage training strategy, incorporating triplet loss, improves the model's robustness and achieves significant improvements in training speed and accuracy. Few‐shot learning enables machines to learn efficiently from limited labelled data. However, existing few‐shot learning methods may perform poorly when there is a lack of sufficient samples, and may encounter problems such as domain shift or overfitting when applied to new domains or tasks. To address the issues of poor fitting and insufficient generalization ability in new domains, a new method called triplet merged network with involution operators (TMNIO) is proposed. This method employs dual encoders that extract common and distinctive features from the prototype network, thereby enhancing the model's feature extraction capability. To further improve this ability, the traditional convolutional kernels are replaced with involution operators, which not only reduce the parameter count but also enlarge the receptive field to better extract local feature information. Additionally, this method employs a two‐stage training strategy, where triplet loss is used in the first stage to train the model and enhance its robustness and generalization ability. Extensive experiments on the miniImageNet, Omniglot, and Caltech‐UCSD Birds‐200 (CUB) datasets have shown that our proposed method achieved significant improvements in both training speed and accuracy, particularly on the miniImageNet dataset, where it achieved an outstanding 10% performance improvement.
computer science, artificial intelligence,engineering, electrical & electronic,imaging science & photographic technology