Embedding metric learning into an extreme learning machine for scene recognition

Chen Wang,Guohua Peng,Bernard De Baets
DOI: https://doi.org/10.1016/j.eswa.2022.117505
IF: 8.5
2022-05-18
Expert Systems with Applications
Abstract:Metric learning can be very useful to improve the performance of a distance-dependent classifier. However, separating metric learning from the classifier learning possibly degenerates the performance, for instance in scene recognition, especially for some complicated scene images. To address this issue, we propose to embed metric learning into an extreme learning machine (EML-ELM) to tackle scene recognition. Specifically, metric learning is conducted to fully explore discriminative features by taking into account all label information, rendering samples of the same class more compact and those of different classes more separable. An extreme learning machine is employed as a classifier thanks to its effectiveness and fast learning process. By explicitly embedding metric learning into an extreme learning machine, we can jointly learn the discriminative features and an effective classifier in a unified framework, thereby improving the recognition performance for complicated scene images. Extensive experiments on four benchmark scene datasets demonstrate the competitive performance of EML-ELM in comparison with state-of-the-art methods.
computer science, artificial intelligence,engineering, electrical & electronic,operations research & management science
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