Abstract:The possibility of using axial spin color centers with $S=3/2$, oriented along the hexagonal $c$ axis in a silicon carbide (SiC) wafer, has been demonstrated for all-optical measurement of projection of the external magnetic field coinciding with the $c$ axis of the crystal, and the polar and azimuthal angles of the external measured magnetic field at room and significantly higher temperatures. A distinctive feature of spin centers in SiC, in which optically induced spin alignment is carried out, is the presence of a unique system of spin levels in a magnetic field, caused by fine structure interaction and hyperfine interaction with the $^{29}$Si nuclei and there is a wide range of level anticrossings (LACs), leading to an exceptionally strong change in photoluminescence in the region of LAC and the dependence of the LAC spectrum on the orientation of the external measured magnetic field, which made it possible to develop the all-optical vector magnetometry method. Such measurements do not require microwave radiation, it is possible to use single spin center for the all-optical vector magnetometry. The proposed magnetometer is based on an external magnetic field cancellation scheme, which leads to a LAC spectrum observed in a zero external magnetic field, called its reference spectrum, by maintaining a local region of zero magnetic field at the site of optical excitation of spin centers. 4H-SiC plate is placed on the scanning stage of a confocal microscope inside the Helmholtz coils. Sensitivity to a constant magnetic field for $z$ component of the magnetic field ${B}_{z}$ is better than $0.1\mu$T$/\sqrt{\text{Hz}}$ in a volume of $1\times10^{-8}$mm$^{3}$ at room temperature. The sensitivity of determining the angles polar and azimuthal is determined by the sensitivity to determining the perpendicular component of the magnetic field, which is better than $5~\mu$T$/\sqrt{\text{Hz}}$.

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