Raman Spectroscopy as a Method for Structural Characterization of Zno-Based Systems at the Nanoscale

Ana Laura Curcio,Marcio Peron Franco de Godoy,Ariano De Giovanni Rodrigues
DOI: https://doi.org/10.2139/ssrn.4336682
2023-01-01
SSRN Electronic Journal
Abstract:We present a straightforward method for determining the crystalline coherence length (Dc) of ZnO-based systems with long-range order in the scale of tens of nanometers. The equation proposed enables calculating Dc simply by taking the intensities of two peaks of a Raman measurement. For ZnO-based systems with typical range order at the nanoscale, the relative intensities of the Raman peaks are strongly dependent on the laser wavelength used as excitation. The development of this methodology, which can be applied to measurements taken with most of the visible lasers available for Raman experiments, was only achieved through the combination of thorough Raman analyses and the possibility of production of ZnO system with well-controlled crystalline domain size using mechanical processing in high-energy milling. A significant competitive advantage stands out in the fact that Raman spectra are very sensitive even to slight structural modifications that are below the detection limit of conventional characterization techniques, such as X-rays diffraction, and the versatile and easy way of performing in-situ analyses, in addition to the possibility to take measurements with microscopic spatial resolution without the demand for large X-ray sources or synchrotron environments.
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