Abstract:Due to the ubiquitous presence of missing values (MVs) in real-world datasets, the MV imputation problem, aiming to recover MVs, is an important and fundamental data preprocessing step for various data analytics and mining tasks to effectively achieve good performance. To impute MVs, a typical idea is to explore the correlations amongst the attributes of the data. However, those correlations are usually complex and thus difficult to identify. Accordingly, we develop a new deep learning model called <i>MIssing Data Imputation denoising Autoencoder</i> (MIDIA) that effectively imputes the MVs in a given dataset by exploring non-linear correlations between missing values and non-missing values. Additionally, by considering various data missing patterns, we propose two effective MV imputation approaches based on the proposed MIDIA model, namely MIDIA-Sequential and MIDIA-Batch. MIDIA-Sequential imputes the MVs attribute-by-attribute sequentially by training an independent MIDIA model for each incomplete attribute. By contrast, MIDIA-Batch imputes the MVs in one batch by training a uniform MIDIA model. Finally, we evaluate the proposed approaches by experimentation in comparison with existing MV imputation algorithms. The experimental results demonstrate that both MIDIA-Sequential and MIDIA-Batch achieve significantly higher imputation accuracy compared with existing solutions, and the proposed approaches are capable of handling various data missing patterns and data types. Specifically, MIDIA-Sequential performs better than MIDIA-Batch for data with monotone missing pattern, while MIDIA-Batch performs better than MIDIA-Sequential for data with general missing pattern.

Multi-feature generation network-based imputation method for industrial data with high missing rate

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