Super-Resolution and Optical Phase Retrieval Using Ptychographic Structured Illumination Microscopy
Shin Usuki,Keichi Kuwae,Tadatoshi Sekine,Kenjiro T. Miura
DOI: https://doi.org/10.1007/s12541-024-01009-4
IF: 2.0411
2024-05-25
International Journal of Precision Engineering and Manufacturing
Abstract:Recently, the demand for 3D microscopic observation of optically transparent biological cells and optical components with micro-sized structures has increased. This demand stems from the continuous development of bio-medical and precision machinery engineering. Various microscopic observation methods for phase objects, such as laser confocal fluorescence and phase contrast microscopy exist. However, these methods have some limitations. The former suffers from the problem of sample contamination by fluorescent staining, whereas the latter is faced with challenges in achieving quantitative measurements, particularly for thick samples. To address these issues, this study focuses on a common optical microscope with non-destructive, noncontact, and low-cost capabilities for both transmission and reflection observations. However, two critical problems arise during image acquisition using the common optical microscope. First, the resolution decreases owing to the diffraction limit of optics. Second, phase information is lost in the image acquired by an image sensor. Generally, a quantitative 3D measurement of the sample obtained by utilizing an optical microscope requires amplitude and phase information of light. Therefore, we propose ptychographic structured illumination microscopy (SIM). This is a combination of the SIM and ptychographic reconstruction of the phase information of light. It enables both super-resolution and phase retrieval in optical microscopic imaging. First, we designed a numerical model of the proposed ptychographic SIM and subsequently evaluated its performance through a series of numerical simulations. Next, we developed an experimental setup and successfully improved the resolution by approximately a factor of two approximately, while quantitatively recovering optical phase information as well.
engineering, mechanical, manufacturing