Investigating UV photodetector capabilities of Pd-Functionalized NiO thin films with interdigitated Pt electrodes

Stuti Srivastava,Aditya Yadav,Charu Dwivedi,Abhijeet Dhanda,Govind Gupta,Preetam Singh

DOI: https://doi.org/10.1016/j.matlet.2024.137211

IF: 3

2024-08-19

Materials Letters

Abstract:In this study, Palladium functionalized NiO thin films (Pd/NiO) were successfully deposited using a sputtering technique for the photodetector application. FESEM and EDX analysis were performed to confirm the morphology and the presence of constituent elements in the Pd/NiO films. The defect states and surface chemistry were analyzed using XPS, and PL measurements. The Pd/NiO thin film exhibited excellent responsivity (∼62 mA/W) and detectivity (∼31.7 × 10 6 Jones) at a low power density of 200 μW/cm 2 in the UV range (∼355 nm). Additionally, the low Noise Equivalent Power (NEP) of ∼ 1.78 × 10 -9 WHz −1/2 at 200 μW indicates the Pd/NiO photodetector capability to effectively detect light signals even at low optical power for various applications.

materials science, multidisciplinary,physics, applied