Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles

James P. Horwath,Leena Vyas,Dmitri N. Zakharov,Rémi Mégret,Peter W. Voorhees,Eric A. Stach
DOI: https://doi.org/10.1017/s1431927622011588
IF: 4.0991
2022-07-23
Microscopy and Microanalysis
Abstract://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927622011588/resource/name/firstPage-S1431927622011588a.jpg
materials science, multidisciplinary,microscopy
What problem does this paper attempt to address?