Analysis of Multiple-ion Events in Atom Probe Tomography Studies of MoNbTi and HfNbTaTiZr Refractory High Entropy Alloys

Patrick G. Callahan,Keith E. Knipling,D. Beaudry
DOI: https://doi.org/10.1017/s1431927622003270
IF: 4.0991
2022-07-23
Microscopy and Microanalysis
Abstract://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927622003270/resource/name/firstPage-S1431927622003270a.jpg
materials science, multidisciplinary,microscopy
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