Angstrom-scale Magnetic Measurements of a Metallic Antiferromagnet with 4D-STEM
Jeffrey Huang,Kayla Nguyen,Manohar Karigerasi,Kisung Kang,André Schleife,Daniel Shoemaker,David Cahill,Jian-Min Zuo,Pinshane Huang
DOI: https://doi.org/10.1017/s143192762100060x
IF: 4.0991
2021-01-01
Microscopy and Microanalysis
Abstract:Antiferromagnets have recently attracted significant interest for their potential use in spintronic devices. Due to their switching frequencies in the terahertz range, antiferromagnets have the potential to produce fast, dense computer memories[1]. Existing magnetic imaging techniques such as Lorentz TEM[2], electron holography[3,4], and differential phase contrast scanning transmission electron microscopy (DPC-STEM)[5,6] have been used effectively to image magnetic domains and topological structures of magnetism such as skyrmions[7] with spatial resolution of a couple of nanometers[7,8]. However, higher spatial resolution is needed to study the spin arrangements of antiferromagnets near domain boundaries, defects, and interfaces.