A Method for Image Recognition of Insulator Jacket Defects under Small Sample Conditions

Xinhai Li,Lingcheng Zeng,Yongyin Lu,Yuede Lin,Xinxiong Zeng
DOI: https://doi.org/10.1088/1742-6596/2160/1/012062
2022-01-01
Journal of Physics: Conference Series
Abstract:Abstract Accurate identification of insulator jacket defect images requires a large number of samples for model training, and the actual defect image datasets available for model training is seriously insufficient. In order to solve the problems of the model cannot be trained, over-fitting and low accuracy caused by too few training samples, this paper proposes a new method for image recognition of insulator jacket defects under small sample conditions, which combines image enhancement technology and meta-learning technology to train the U-Net image segmentation network, and finally obtain the image recognition model of the insulator jacket defect. In this paper, the defect recognition models using meta-learning method and without meta-learning are compared experimentally, and the results show that the proposed method can achieve accurate recognition with a small-scale original data set.
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