On Parameter Estimation for a Position-Dependent Marking of a Doubly Stochastic Poisson Process

Heide Wendt,Waltraud Kahle
DOI: https://doi.org/10.1007/978-0-8176-8206-4_29
2004-01-01
Abstract:For analyzing reliability of technical systems it is often important to investigate damage processes. In this paper we describe a damage process (Zt) which is assumed to be generated by a positionependent marking of a doubly stochastic Poisson process. For some parametric intensity kernels of the corresponding marked point process we determine maximum-likelihood estimations. Censored observations are taken into account. Furthermore, the large sample case is considered.1
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