EEDD: Edge-Guided Energy-Based PCB Defect Detection
Shuixin Deng,Lei Deng,Ting Sun,Shijie Yu,Li Wang,Baohua Chen,Hao Hu,Yusen Xie,Hanxi Yin,Junwei Xiao,Xinglong Cui,Yeyu Fu,Xuewei Tang,Ruirui Song,Lin Li,Shanpeng Xiao,Yuan Li,Yizheng Li
DOI: https://doi.org/10.3390/electronics12102306
IF: 2.9
2023-05-20
Electronics
Abstract:Printed circuit board (PCB) defect detection is critical for ensuring the safety of electronic devices, especially in the space industry. Non-reference-based methods, typically the deep learning methods, suffer from a large amount of annotated data requirements and poor interpretability. In contrast, conventional reference-based methods achieve higher detection accuracy by comparing with a template image but rely on precise image alignment and face the challenge of fine defects detection. To solve the problem, we propose a novel Edge-guided Energy-based PCB Defect Detection method (EEDD). We focus on the salient edge characteristic of PCB images and regard the functional defects as contour differences and then propose a novel energy measurement method for PCB contour anomaly detection. We introduce the energy transformation using the edge information of the template and test image, then Speeded-Up Robust Features method (SURF) is used for image alignment, and finally achieve defect detection by measuring the energy anomaly score pixel by pixel with the proposed energy-based defect localization and contour flood fill methods. Our method excels in detecting multi-scale defects, particularly tiny defects, and is robust against interferences such as non-finely aligned images and edge spurs. Experiments on the DeepPCB-A dataset and our high-resolution PCB dataset (HDPCB) show that the proposed method outperforms state-of-the-art methods in PCB defect-detection tasks.
engineering, electrical & electronic,computer science, information systems,physics, applied