The Cognitive Approach to the Coverage-Directed Test Generation

Anna Klimenko,Galina Gorelova,Vladimir Korobkin,Petr Bibilo
DOI: https://doi.org/10.1007/978-3-319-67621-0_34
2017-09-05
Abstract:AbstractThe important contemporary issue of VLSI design verification is its time-consuming. The hardware model, written, for instance, with VHDL, is verified by formal and dynamic verification approaches. Dynamic verification (simulation) is widely-used due to the possibility of full automation of the process, but takes too much time due to its redundancy.The concept of the coverage-directed test generation is to redirect the test generator such as to reach uncovered metric points. There are several approaches for this, including genetic algorithms using, Bayesian network, Data mining, etc.The new cognitive approach to the coverage-directed test generation (CA CDG) is proposed within this paper. It is based on a cognitive map usage. The CA CDG is described, some simulation results are given. Also the future work areas are outlined.
What problem does this paper attempt to address?