Automatic evaluation and generation method of long-term stability of HgCdTe infrared focal plane array

Genwu Li,Dan Zeng,Fansheng Chen
DOI: https://doi.org/10.1117/12.2628618
2022-02-16
Abstract:The stability of the infrared focal plane array (FPA) is the key to long-term quantitative testing. Due to the influence of external factors, such as thermal shock, vibration, temperature drift, etc., the response of the infrared array detector will change to a certain extent. The drift of the response will cause the generation of new blind pixel and the change of response non-uniformity, which will seriously affect the image quality, and the traditional long-term stability measurement method is inefficient. In response to the above problems, we propose a novel protocol and method to automatically characterize the temporal stability of infrared detector, which can automatically generate performance parameters such as infrared detector response rate and non-uniformity to evaluate the stability. The research provides valuable experience for the longterm analysis of HgCdTe infrared focal plane array.
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