Abstract:CMOS Monolithic Active Pixel Sensors (MAPS) are considered as an emerging technology in the field of charged particle tracking. They will be used in the vertex detectors of experiments like STAR, CBM and ALICE and are considered for the ILC and the tracker of ATLAS. In those applications, the sensors are exposed to sizeable radiation doses. While the tolerance of MAPS to ionizing radiation and fast hadrons is well known, the damage caused by low energy neutrons was not studied so far. Those slow neutrons may initiate nuclear fission of $^{10}$B dopants found in the B-doped silicon active medium of MAPS. This effect was expected to create an unknown amount of radiation damage beyond the predictions of the NIEL (Non Ionizing Energy Loss) model for pure silicon. We estimate the impact of this effect by calculating the additional NIEL created by this fission. Moreover, we show first measured data for CMOS sensors which were irradiated with cold neutrons. The empirical results contradict the prediction of the updated NIEL model both, qualitatively and quantitatively: The sensors irradiated with slow neutrons show an unexpected and strong acceptor removal, which is not observed in sensors irradiated with MeV neutrons.

Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation

Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor

High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors

Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors

Radiation damage caused by cold neutrons in boron doped CMOS active pixel sensors

Combined Reactor Neutron Beam and 60co Γ-Ray Radiation Effects on CMOS APS Image Sensors

Synergistic Radiation Effects in PPD CMOS Image Sensors Induced by Neutron Displacement Damage and Gamma Ionization Damage

Radiation Effects in Backside-Illuminated CMOS Image Sensors Irradiated by High Energy Neutrons at CSNS-WNS

Radiation Induced Effects in a Monolithic Active Pixel Sensor : The Mimosa8 Chip

Displacement Damage Effects in Backside Illuminated CMOS Image Sensors

Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors

Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor

Heavy Ion Irradiation Induced Single Particle Displacement Damage in 8T Global Shutter CMOS Image Sensor

Overview of Ionizing Radiation Effects in Image Sensors Fabricated in a Deep-Submicrometer CMOS Imaging Technology

Alpha Particle-Induced Persistent Effects in a COTS 3D-Integrated CMOS Imager

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Radiation effects on a radiation-tolerant CMOS active pixel sensor

Radiation Effects Due to 3MeV Proton Irradiations on Back-Side Illuminated CMOS Image Sensors

Influence of Neutron Radiation on Performance of Color CMOS Image Sensors