Abstract:Synchrotron high-resolution powder X-ray diffraction (HRPXRD) data and Rietveld structure refinements were used to examine the crystal structures of quartz, sodalite, tremolite, and meionite Me79.6, and compare them with those obtained by single-crystal diffraction (SXTL). The purpose is to illustrate that crystal structures obtained by HRPXRD are comparable to those obtained by SXTL. The comparisons indicate important and significant differences between the structures obtained by the two methods. The cell parameters obtained by Rietveld refinements using HRPXRD data appear of superior quality to those obtained by SXTL. The <Si–O> distances in pure SiO4 tetrahedron in quartz, sodalite, and tremolite are 1.6081(3), 1.6100(2), and 1.620(1) Å, respectively. These values are affected by interstitial cations. In meionite Me79.6, the average <T1–O> and <T2–O> distances are 1.647(1) and 1.670(1) Å, respectively, and they indicate that the occupancies are (Al0.28Si0.72) for T1 where the atoms are partially ordered and (Al0.45Si0.55) for T2 site where the atoms are nearly disordered, based on sodalite Si–O and Al–O distances of 1.6100(2) and 1.7435(2) Å, respectively. Nous nous sommes servis des données diffractométriques sur poudre obtenues en rayonnement synchrotron avec détecteurs à résolution élevée et d’un affinement de Rietveld de ces données pour établir la structure du quartz, de la sodalite, la trémolite et la méionite Me79.6, en vue de les comparer avec les résultats d’affinements obtenus sur monocristaux. Notre but était de comparer la qualité des descriptions structurales obtenues par les deux méthodes. Ces comparaisons révèlent des différences importantes. Les paramètres réticulaires obtenus par affinement de Rietveld en utilisant les données obtenues sur poudre à résolution élevée s’avèrent supérieurs en qualité à ceux découlant de l’affinement de données obtenues sur monocristal. Les distances <Si–O> des tétraèdres SiO4 dans le quartz, la sodalite et la trémolite sont 1.6081(3), 1.6100(2), et 1.620(1) Å, respectivement. Ces valeurs dépendent de la présence de cations interstitiels. Dans la méionite Me79.6, la longueur moyenne des liaisons <T1–O> et <T2–O> est 1.647(1) et 1.670(1) Å, respectivement, distances qui sont conformes à un taux d’occupation de (Al0.28Si0.72) pour T1, où les atomes seraient partiellement ordonnés, et (Al0.45Si0.55) pour T2, où les atomes sont presque totalement désordonnés, en nous basant sur les distances Si–O et Al–O de 1.6100(2) et 1.7435(2) Å, respectivement, déterminées pour la sodalite. (Traduit par la Rédaction)

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