XPS fitting model proposed to the study of Ni and La in deactivated FCC catalysts

Álvaro A. Amaya,Carlos A. González,Martha E. Niño-Gómez,Fernando Martínez O.
DOI: https://doi.org/10.1016/j.elspec.2019.03.007
IF: 1.993
2019-05-01
Journal of Electron Spectroscopy and Related Phenomena
Abstract:Herein, a methodology to study the content of nickel and lanthanum by X-Ray photoelectron spectroscopy - XPS in FCC catalyst was developed. A critical problem to study the nickel in this type of material is related to the overlapping between Ni 2p3/2 and La 3d3/2 signals. In order to have an accurate and correct interpretation of XPS spectra, La 3d and Ni 2p signals were studied individually employing synthesized and FCC catalyst samples. Fitting parameters such as: background modeling method and fitting constraints were determined and tested in synthesized and FCC catalysts samples. Finally, the XPS fitting method obtained was employed to study the La 3d/Ni 2p region in FCC catalyst samples, showing a good performance to study this region.
spectroscopy
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