Amorphous Silicon Self‐Rolling Micro Electromechanical Systems: From Residual Stress Control to Complex 3D Structures

Rui M. R. Pinto,Virginia Chu,João Pedro Conde
DOI: https://doi.org/10.1002/adem.201900663
IF: 3.6
2019-08-08
Advanced Engineering Materials
Abstract:In surface micromachining, the control of the residual stress of the films is crucial, as excessive stress can cause buckling, cracking and peeling of the materials and fracture of the devices. However, the gradients of stress across the thickness of individual films or the stress mismatch in composite structural layers can be exploited to obtain highly complex 3D structures via self‐assembly, self‐bending, self‐positioning or self‐rolling processes. In this paper, the thin film residual stresses of amorphous silicon, TiW, AlSiCu, Cr, Au and SiO2 are assessed using polymer substrates and tuned. Then, a stress‐mismatched bi‐layer of amorphous silicon (tensile) and TiW (compressive) is used in the fabrication of complex 3D self‐rolling MEMS structures. The freestanding regions of the fabricated MEMS have a characteristic radius of curvature of ∼100 μm. Current‐induced thermal actuation of a suspended plate is demonstrated. The microfabrication process and materials used are compatible with standard cleanroom processing and with a variety of substrates. In the future, amorphous silicon photodiodes, photoconductors or other semiconductor devices can be incorporated on complex MEMS fabricated by self‐rolling/self‐bending processes and applied to localized optical and electrical sensing.This article is protected by copyright. All rights reserved.
materials science, multidisciplinary
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