The High Speed 3D Measurement Based on Interval Line Structured Light Method for Translucent Objects

Huijie Zhao,Xiaochun Diao,Hongzhi Jiang,Xudong Li

DOI: https://doi.org/10.1007/978-981-13-9917-6_9

2019-01-01

Abstract:Nowadays, modern manufacturing fields may encounter plastic, nylon, porcelain and other minerals which have translucent surface that would contrast the blurring of projection. It is one of the biggest bottleneck problems in the using of new materials. There are many optical methods indicates solving this problem in the past few years where cameras are used. Among all the optical methods, epipolar line projection method is the most efficient category that could acquire dense point clouds of object surface whose accuracy is equivalent to traditional methods. This paper presents a high speed 3D profile measurement based on triangular pattern motion blur method using interval line projection which derives from epipolar line projection. The experiments indicate that the proposed method can achieve high-speed 3D measurement of translucent objects. The measurement time of translucent objects is 0.091 s.