Piezopotential in a composite cantilever of piezoelectric dielectrics and nonpiezoelectric semiconductors produced by shear force through e 15

Kai Fang,Zhenghua Qian,Jiashi Yang
DOI: https://doi.org/10.1088/2053-1591/ab4bf5
IF: 2.025
2019-10-16
Materials Research Express
Abstract:Abstract We propose a specific composition of a beam of a piezoelectric dielectric layer sandwiched between two nonpiezoelectric semiconductor layers. A one-dimensional theoretical model is established for the bending of the beam with shear deformation. A theoretical analysis of a cantilever of such a beam under an end shear force is performed. Results show that an axial electric field develops in the beam because of the shear deformation accompanying bending via the piezoelectric constant e 15 . The axial electric field drives the charge carriers to the two ends of the beam. Thus the proposed composite beam can be used as a new and basic structure with potential applications in piezotronics when the shear force is present or dominant, differing from the homogeneous beam and the composite beam using e 33 in the literature which are more suitable when bending moment is dominant.
materials science, multidisciplinary
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