Photovoltaic defect classification through thermal infrared imaging using a machine learning approach

Christopher Dunderdale,Warren Brettenny,Chantelle Clohessy,E. Ernest Dyk
DOI: https://doi.org/10.1002/pip.3191
2019-12-14
Progress in Photovoltaics: Research and Applications
Abstract:<p>This study examines a deep learning and feature‐based approach for the purpose of detecting and classifying defective photovoltaic modules using thermal infrared images in a South African setting. The VGG‐16 and MobileNet models are shown to provide good performance for the classification of defects. The scale invariant feature transform (SIFT) descriptor, combined with a random forest classifier, is used to identify defective photovoltaic modules. The implementation of this approach has potential for cost reduction in defect classification over current methods.</p>
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