Instrument with an ultra-wide dynamic detection range for the optical counting and sizing of individual particles in suspensions
Martin Hussels,Heinz Lichtenfeld,Holger Woehlecke,Elia Wollik,Dietmar Lerche
DOI: https://doi.org/10.1063/5.0165811
IF: 1.6
2024-02-01
Review of Scientific Instruments
Abstract:The characterization of dispersions, suspensions, and emulsions is important in a wide range of scientific applications and industries. Samples can consist of different materials and a wide range of particle sizes and concentrations. A single particle sizing and counting instrument with a dynamic detection range of ≥6 decades has been developed to detect single nano- and microparticles in aqueous suspensions based on light scattering measured in two directions. Hydrodynamic focusing is employed for particle separation and to provide stable conditions for light scattering detection. This gives the advantage of size resolution in the nm range, allowing, e.g., number based size distributions, classification of nanomaterials, determination of particle agglomerates, developments for dispersion stability analysis, or cutoff of filter media. In addition, concentration determination is based on sample volume measurement with <20 nl measurement uncertainty. We present results of particle detection in a size range from approximately above 40 nm for gold nanoparticles to 8 μm for polystyrene particles using a prototyped instrument of the LUMiSpoc® series produced by LUM GmbH. The data obtained demonstrate the advantages of single-particle detection, particularly for characterizing polydisperse systems, such as precise particle sizing in the nanometer range through light scattering intensity based on Mie scattering theory. In addition, we present particle concentration data based on the integrated measurement of sample volume, which allows particle concentration to be determined with an uncertainty of 2.5% (95% confidence interval). To achieve such small uncertainties, dilution series measurements must be used to correct for coincidence losses and particle adhesion.
instruments & instrumentation,physics, applied