Meta-QTL analysis of tan spot resistance in wheat

Yuan Liu,Evan Salsman,Runhao Wang,Nelomie Galagedara,Qijun Zhang,Jason D. Fiedler,Zhaohui Liu,Steven Xu,Justin D. Faris,Xuehui Li
DOI: https://doi.org/10.1007/s00122-020-03604-1
IF: 5.4
2020-05-20
Theoretical and Applied Genetics
Abstract:A total of 19 meta-QTL conferring resistance to tan spot were identified from 104 initial QTL detected in 15 previous QTL mapping studies.
plant sciences,genetics & heredity,horticulture,agronomy
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