Sildenafil tablet analyzed by XPS

Jhonatan Rodriguez-Pereira,Sergio A. Rincón-Ortiz,Rogelio Ospina
DOI: https://doi.org/10.1116/6.0000609
2020-12-01
Surface Science Spectra
Abstract:Sildenafil tablet was analyzed by x-ray photoelectron spectroscopy. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, N 1s, S 2p, Si 2p, Mg 1s, and Na 1s core levels spectra were acquired. Results showed the presence of carbon, oxygen, nitrogen, and sulfur, elements that constitute sildenafil; however, carbon and oxygen are also found in other ingredients (excipients). Additionally, the presence of silicon, sodium, and magnesium is associated with excipients.
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