ASSESSMENT OF GENETIC PARAMETERS FOR EARLY MATURING AND GRAIN YIELD IN SOME BREAD WHEAT CROSSES UNDER OPTIMUM AND LATE SOWING DATES

DOI: https://doi.org/10.21608/ejas.2020.136366
2020-11-01
Egyptian Journal of Applied Science
Abstract:ABSTRACTConsiderable attention is paid in the Egyptian National WheatResearch Program to develop early maturing and high yielding cultivars.Therefore, six early to moderate maturing bread wheat lines were crossed toproduce three cross populations. The six populations model was usedthrough three growing seasons from 2017/18 to 2019/20. The objective wasto determine the intra- and inter-allelic gene interactions controllingearliness and some agronomic traits as well as identify the best germplasmwhich had accumulated early maturing gene pool. Results showed that latesowing date in end of December decreased all studied traits. Both additiveand dominance gene effects and variances were important in inheritance ofthe studied traits. Additive effects and variance were larger thancorresponding dominance ones in most cases. Heritability in broad andnarrow sense and expected genetic advance as percent of F2 mean weremoderate to high for all the studied traits. Negative and significantphenotypic and genotypic correlation between grain yield and earliness traitswere obtained. Generally, most biometrical parameters resulted from cross 2(line 3 x line 4) and cross 3 (line 5 x line 6) were higher in magnitudecompared to cross 1 (line 1 x line 2), thus, these two crosses would be usedin breeding program for improving earliness and grain yield traits.
What problem does this paper attempt to address?