Super-Resolution Enhancement Method Based on Generative Adversarial Network for Integral Imaging Microscopy

Md. Shahinur Alam,Ki-Chul Kwon,Munkh-Uchral Erdenebat,Mohammed Y. Abbass,Md. Ashraful Alam,Nam Kim
DOI: https://doi.org/10.3390/s21062164
IF: 3.9
2021-03-19
Sensors
Abstract:The integral imaging microscopy system provides a three-dimensional visualization of a microscopic object. However, it has a low-resolution problem due to the fundamental limitation of the F-number (the aperture stops) by using micro lens array (MLA) and a poor illumination environment. In this paper, a generative adversarial network (GAN)-based super-resolution algorithm is proposed to enhance the resolution where the directional view image is directly fed as input. In a GAN network, the generator regresses the high-resolution output from the low-resolution input image, whereas the discriminator distinguishes between the original and generated image. In the generator part, we use consecutive residual blocks with the content loss to retrieve the photo-realistic original image. It can restore the edges and enhance the resolution by ×2, ×4, and even ×8 times without seriously hampering the image quality. The model is tested with a variety of low-resolution microscopic sample images and successfully generates high-resolution directional view images with better illumination. The quantitative analysis shows that the proposed model performs better for microscopic images than the existing algorithms.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
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