Shot‐noise measurements of the electron charge: An undergraduate experiment

D. R. Spiegel,R. J. Helmer
DOI: https://doi.org/10.1119/1.17867
IF: 0.835
1995-06-01
American Journal of Physics
Abstract:We report the design and performance of a simple apparatus for measurement of shot-noise fluctuations in the current from a vacuum photodiode illuminated with a pilot-lamp light bulb. After calibrating the frequency-dependent gain of the measurement electronics, the charge e of the electron can be obtained by measuring the mean-square shot noise as a function of the dc photodiode current. We employ op-amp circuits and a rms-to-dc integrated circuit to amplify, filter, and detect the shot noise, so that commercial bandpass filters and rms voltmeters are unnecessary. The apparatus is therefore not expensive and can be built using readily available components. Repeated measurements employing different pilot lamps yield a value of e=(1.581±0.015±0.032)×10−19 C, where the uncertainties represent random (2σmean) and systematic error, respectively. The experiment thus permits reasonably precise measurements of a fundamental constant while allowing the undergraduate student to gain a hands-on understanding of fluctuation phenomena.
physics, multidisciplinary,education, scientific disciplines
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