Abstract:This work combines the cryo‐electron microscopy and image analysis using angular autocorrelation algorithms to visualize the nanoscale molecular ordering in organic semiconducting material. This technique maps the local edge‐on and face‐on orientation of donor and acceptor material in the blend film and provides a methodology to understand the effect of organic material and processing condition on the device performance. The efficiency of an organic solar cell is highly dependent on the complex, interpenetrating morphology, and molecular order within the composite phases of the bulk heterojunction (BHJ) blend. Both these microstructural aspects are strongly influenced by the processing conditions and chemical design of donor/acceptor materials. To establish improved structure‐function relationships, it is vital to visualize the local microstructural order to provide specific local information about donor/acceptor interfaces and crystalline texture in BHJ blend films. The visualization of nanocrystallites, however, is difficult due to the complex semi‐crystalline structure with few characterization techniques capable of visualizing the molecular ordering of soft materials at the nanoscale. Here, it is demonstrated how cryo‐electron microscopy can be utilized to visualize local nanoscale order. This method is used to understand the distribution/orientation of crystallites in a BHJ blend. Long‐range (>300 nm) texturing of IEICO‐4F crystallites oriented in an edge‐on fashion is observed, which has not previously been observed for spin‐coated materials. This approach provides a wealth of quantitative information about the texture and size of nanocrystallites, which can be utilized to understand charge generation and transport in organic film. This study guides tailoring the material design and processing conditions for high‐performance organic optoelectronic devices.

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