Defect segmentation for multi-illumination quality control systems

David Honzátko,Engin Türetken,Siavash A. Bigdeli,L. Andrea Dunbar,Pascal Fua
DOI: https://doi.org/10.1007/s00138-021-01244-z
IF: 2.983
2021-09-23
Machine Vision and Applications
Abstract:Abstract Thanks to recent advancements in image processing and deep learning techniques, visual surface inspection in production lines has become an automated process as long as all the defects are visible in a single or a few images. However, it is often necessary to inspect parts under many different illumination conditions to capture all the defects. Training deep networks to perform this task requires large quantities of annotated data, which are rarely available and cumbersome to obtain. To alleviate this problem, we devised an original augmentation approach that, given a small image collection, generates rotated versions of the images while preserving illumination effects, something that random rotations cannot do. We introduce three real multi-illumination datasets, on which we demonstrate the effectiveness of our illumination preserving rotation approach. Training deep neural architectures with our approach delivers a performance increase of up to 51% in terms of AuPRC score over using standard rotations to perform data augmentation.
computer science, cybernetics, artificial intelligence,engineering, electrical & electronic
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