Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics

Gang Niu,Satnam Singh,Steven W. Holland,Michael Pecht
DOI: https://doi.org/10.1016/j.microrel.2010.09.009
IF: 1.6
2011-02-01
Microelectronics Reliability
Abstract:This paper presents a novel approach for health monitoring of electronic products using the Mahalanobis distance (MD) and Weibull distribution. The MD value is used as a health index, which has the advantage of both summarizing the multivariate operating parameters and reducing the data set into a fused distance index. The Weibull distribution is used to determine health decision metrics, which are useful in characterizing distributions of MD values. Furthermore, a case study of notebook computer health monitoring system is carried out. The experimental results show that the proposed method is valuable.
engineering, electrical & electronic,nanoscience & nanotechnology,physics, applied
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