Test Optimization in DNN Testing: A Survey

Qiang Hu,Yuejun Guo,Xiaofei Xie,Maxime Cordy,Lei Ma,Mike Papadakis,Yves Le Traon
DOI: https://doi.org/10.1145/3643678
IF: 3.685
2024-01-27
ACM Transactions on Software Engineering and Methodology
Abstract:This paper presents a comprehensive survey on test optimization in deep neural network (DNN) testing. Here, test optimization refers to testing with low data labeling effort. We analyzed 90 papers, including 43 from the software engineering (SE) community, 32 from the machine learning (ML) community, and 15 from other communities. Our study: (i) unifies the problems as well as terminologies associated with low-labeling cost testing, (ii) compares the distinct focal points of SE and ML communities, and (iii) reveals the pitfalls in existing literature. Furthermore, we highlight the research opportunities in this domain.
computer science, software engineering
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