Deeplab-YOLO: a method for detecting hot-spot defects in infrared image PV panels by combining segmentation and detection
Ye Lei,Xiaoye Wang,Aimin An,Haijiao Guan
DOI: https://doi.org/10.1007/s11554-024-01415-x
IF: 2.293
2024-03-15
Journal of Real-Time Image Processing
Abstract:Aiming at the problem of difficult operation and maintenance of PV power plants in complex backgrounds and combined with image processing technology, a method for detecting hot spot defects in infrared image PV panels that combines segmentation and detection, Deeplab-YOLO, is proposed. In the PV panel segmentation stage, MobileNetV2 was introduced into the Deeplabv3+ model. Empty convolution in the atrous spatial pyramid pooling (ASPP) structure was improved, and established a relationship between layer-level features, the CBAM attention mechanism was combined, which achieved fast and accurate segment of PV panels and avoided false detection of hot spots. In the hot-spot recognition stage, a lightweight MobileNetV3 network was designed to replace the YOLO v5 backbone network, a small defect prediction head was added, and EIOU was used as a loss function, which improved the speed and accuracy of hot-spot detection and enhanced the performance of the YOLO v5 model. The experimental results show that the optimized Deeplabv3+ model and YOLO v5 model improve the accuracy of segmenting PV panels in images and identifying hot-spot defects by 2.61% and 0.7%, respectively, compared with the original model. This proposed method can accurately segment the PV panels and then identify different sizes of hot-spot defects on the PV panels.
computer science, artificial intelligence,engineering, electrical & electronic,imaging science & photographic technology