Unraveling the composition of each atomic layer in the MXene/MAX phase structure – identification of oxycarbides, oxynitrides, and oxycarbonitrides subfamilies of MXenes

Paweł Piotr Michałowski
DOI: https://doi.org/10.1039/d4nh00151f
2024-07-20
Nanoscale Horizons
Abstract:MXenes, the largest known family of 2D materials, are known for their complicated structure consisting of many different elements. Their properties can be finely tuned by precise engineering of the composition of each atomic layer. Thus it is necessary to further develop the secondary ion mass spectrometry (SIMS) technique which can unambiguously identify each element with atomic precision. The newly established protocol of deconvolution and calibration of the SIMS data enables layer-by-layer characterization of MAX phase and MXene samples with ±1% accuracy. Such precision is particularly important for samples that consist of several different transition metals in their structure. It confirms that most MXenes contain a substantial amount of oxygen in the X layers, thus enabling the identification of oxycarbides, oxynitrides, and oxycarbonitrides subfamilies of these materials. It can also be applied for under- and over-etched samples and to determine the exact composition of termination layers. Generally, the SIMS technique may provide invaluable support in the synthesis and optimization of the MAX phase and MXene studies.
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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