Abstract:This paper is a corrigendum to the paper by Beigi et al. published at HPCA 2023 <a class="link-external link-https" href="https://doi.org/10.1109/HPCA56546.2023.10071066" rel="external noopener nofollow">this https URL</a>. The HPCA paper presented a detailed field data analysis of faults observed at scale in DDR4 DRAM from two different memory vendors. This analysis included a breakdown of fault patterns or modes. Upon further study of the data, we found a bug in how we decoded errors based on the logged row-bank-column address. Specifically, we found that some errors that occurred in one column were mis-interpreted as occurring in two non-adjacent columns. As a result of this, some single-bit faults were misclassified as partial-row faults (i.e., two-bit faults). Similarly, some single-column faults were misclassified as two-column faults. The result of these misclassification errors is that the proportion of single-bit faults is higher than reported in the paper, with a commensurate reduction in the fraction of certain types of multi-bit faults. These misclassifications also slightly change the Failure In Time (FIT) per DRAM device values presented in the original paper. In this corrigendum, we provide an updated version of the relevant tables and figures and point out the corresponding page numbers and references in the original paper that they replace.

Corrigendum for February 2024 Article

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