Shape Parameter Estimation of K -Distributed Sea Clutter Using Neural-Network and Multi-Sample-Percentile in Radar Industry

Jian Xue,Mengling Sun,Jun Liu,Shuwen Xu,Meiyan Pan
DOI: https://doi.org/10.1109/tii.2022.3211321
IF: 12.3
2022-01-01
IEEE Transactions on Industrial Informatics
Abstract:In this paper, we consider the problem of robustly and accurately estimating the shape parameters of K-distributed sea clutter in the maritime radar industry. Outliers formed by non-sea-surface echoes have a significant negative impact on the estimation accuracy. To improve the estimation performance, we first propose a bipercentiles feedforward neural network for the shape parameter $\eta$ (BP-FFNN-$\eta$), which utilizes a ratio of two percentiles and a two-hidden-layer feedforward neural network. The BP-FFNN-$\eta$ can learn the mathematical relationship between the shape parameter and the ratio of two percentiles, and can work in environments where the number of outliers is approximately known. Moreover, to solve the case where the number of outliers is not known due to dynamic changes in the environment, we also design another neural network (referred to as MBP-FFNN-$\eta$), which consists of multiple BP-FFNNs-$\eta$ and a multi-class classification network. The MBP-FFNN-$\eta$ can perceive the change in the proportion of outliers, so an accurate estimate can be obtained from an unaffected BP-FFNN-$\eta$. Finally, training and test data are constructed to train and evaluate the proposed methods, respectively. Experimental results demonstrate that the BP-FFNN-$\eta$ performs better than traditional moments-based estimators, and has almost the same performance as the tri-percentile estimator. Compared with the tri-percentile estimator, the BP-FFNN-$\eta$ avoids table lookups, and produces a continuous estimate. The MBP-FFNN-$\eta$ can achieve more than 97 overall classification accuracy on simulated and measured data, and thus an accurate estimate of the shape parameter can be obtained when the number of outliers varies.
automation & control systems,computer science, interdisciplinary applications,engineering, industrial
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