Lightweight transmission line defect identification method based on OFN network and distillation method

Shaotong Pei,Hangyuan Zhang,Yuxin Zhu,Chenlong Hu
DOI: https://doi.org/10.1049/ipr2.13191
IF: 2.3
2024-08-26
IET Image Processing
Abstract:This concise abstract presents a novel lightweight defect detection algorithm for power transmission lines, leveraging the OFN network and distillation techniques to achieve high accuracy with minimal computational resources. The OFN algorithm, enhanced by a modified YOLOv8 for heterogeneous distillation, demonstrates a 70.2% mAP with 18.95 GFLOPs and 343 FPS, offering a promising solution for edge computing applications in power line inspections. Edge devices are increasingly utilized for defect detection in power line inspection, necessitating algorithms that optimize model size and accuracy. This study introduces a lightweight detection method using the Optimized Feature Network with MobileOne‐FPN‐NASHead (OFN network) OFN network and distillation technique. The OFN incorporates a lightweight backbone, neural network search, re‐parametrization, and a feature pyramid to create a compact yet effective detection network. To enhance feature learning, a heterogeneous distillation approach is applied, leveraging a modified YOLOv8 as a teacher network. This modification includes an explicit visual centre for improved global and local information extraction, crucial for dense target detection in power line inspections. Additionally, the Minimize the points distance IoU (MPDloU) loss function is used to improve localization accuracy over the the Complete‐Intersection Over Union (CIoU) loss. Experimental results show a 1.1% mean Average Precision (mAP) increase for the enhanced YOLOv8 and a 70.2% mAP for the OFN network with 18.95 GFLOPs and 343 FPS, achieving a commendable balance between model efficiency and detection performance. The research underscores the viability of the OFN for edge computing in power line defect detection, highlighting the potential of innovative algorithmic structures in this application.
computer science, artificial intelligence,engineering, electrical & electronic,imaging science & photographic technology
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