Industrial surface defect detection by multi-scale Inpainting-GAN

Wei Liu,Cong Wang,Yongkang Zhang
DOI: https://doi.org/10.1007/s00371-024-03743-2
IF: 2.835
2024-12-05
The Visual Computer
Abstract:Defect detection of industrial products is a critical technology for ensuring product quality. Reconstruction methods based on deep networks have gained popularity as effective detection methods. Networks that reconstruct images by learning normal picture representations exhibit a strong ability to generalize to abnormal areas, making the difference between the original and reconstructed images less apparent. To address this challenge, we propose a novel anomaly detection framework called Inpainting-GAN, which incorporates the idea of inpainting from image restoration. Our framework introduces the concept of using masks to transform the image reconstruction process into an restoration way. By training the generative adversarial network to prioritize restoring normal features, the framework aims to enhance the distinction between the reconstructed image and the original input image. We also use a multi-scale mask to solve the problem that a single-scale mask cannot effectively cover large abnormal areas, and use a multi-scale gradient magnitude similarity loss to reduce the impact of scale transformation on the quality of the repaired image. In addition, we locate the abnormal regions of the image according to the multi-scale gradient similarity algorithm. We extensively experimented on the MVTec dataset, surpassing other methods in three categories and achieving superior results. Additionally, our method outperforms other methods in terms of overall average defect detection results.
computer science, software engineering
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