Joint Attention-Guided Feature Fusion Network for Saliency Detection of Surface Defects

Xiaoheng Jiang,Feng Yan,Yang Lu,Ke Wang,Shuai Guo,Tianzhu Zhang,Yanwei Pang,Jianwei Niu,Mingliang Xu
DOI: https://doi.org/10.1109/tim.2022.3218547
IF: 5.6
2022-11-16
IEEE Transactions on Instrumentation and Measurement
Abstract:Surface defect inspection plays an important role in the process of industrial manufacture and production. Though convolutional neural network (CNN)-based defect inspection methods have made huge leaps, they still confront a lot of challenges such as defect scale variation, complex background, low contrast, and so on. To address these issues, we propose a joint attention-guided feature fusion network (JAFFNet) for saliency detection of surface defects based on the encoder–decoder network. JAFFNet mainly incorporates a joint attention-guided feature fusion (JAFF) module into decoding stages to adaptively fuse low-level and high-level features. The JAFF module learns to emphasize defect features and suppress background noise during feature fusion, which is beneficial for detecting low-contrast defects. In addition, JAFFNet introduces a dense receptive field (DRF) module following the encoder to capture features with rich context information, which helps detect defects of different scales. The JAFF module mainly utilizes a learned joint channel-spatial attention map provided by high-level semantic features to guide feature fusion. The attention map makes the model pay more attention to defect features. The DRF module utilizes a sequence of multireceptive-field (MRF) units with each taking as inputs all the preceding MRF feature maps and the original input. The obtained DRF features capture rich context information with a large range of receptive fields. Extensive experiments conducted on SD-saliency-900, magnetic tile, and German Association for Pattern Recognition (DAGM) 2007 indicate that our method achieves promising performance in comparison with other state-of-the-art methods. Meanwhile, our method reaches a real-time defect detection speed of 66 FPS.
engineering, electrical & electronic,instruments & instrumentation
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