Dual Contrastive Learning for Semi-Supervised Fault Diagnosis Under Extremely Low Label Rate

Linghui Lu,Jun Wang,Weiguo Huang,Changqing Shen,Juanjuan Shi,Zhongkui Zhu
DOI: https://doi.org/10.1109/tim.2023.3284954
IF: 5.6
2023-06-27
IEEE Transactions on Instrumentation and Measurement
Abstract:The application of deep learning in the field of fault diagnosis has achieved excellent performance in these years. However, most fault diagnosis models rely on large amounts of labeled data. In engineering practice, labeling large amounts of data requires a lot of manpower and expert knowledge. Industrial datasets typically have low label rates. To address the challenge in fault diagnosis under extremely low label rate, this article proposes a new semi-supervised fault diagnosis method using a novel contrastive learning model named dual contrastive learning (DCL). The designed DCL model can extract more representative features through a structure with dual contrast. Specifically, the semi-supervised fault diagnosis method contains two stages: pretraining and fine-tuning. In the first stage, the DCL is pretrained by augmented time-frequency versions of the bearing vibration signals, which are obtained by a time-frequency transform with different window lengths. In the second stage, label diffusion module (LDM) is applied to extend the limited label information to the large unlabeled data so as to increase the label rate. In addition, the whole diagnosis module rather than only the last layer is finetuned so that each layer of the module can fit the current diagnosis task. The proposed method was experimented on a public dataset and two self-built datasets under varying working conditions. The comparison results show that in the extreme case of 1% label rate, the proposed method is superior to the existing methods in terms of diagnosis accuracy, convergence speed, and stability.
engineering, electrical & electronic,instruments & instrumentation
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