Nitric acid passivation of Ti6Al4V reduces thickness of surface oxide layer and increases trace element release

B W Callen,B F Lowenberg,S Lugowski,R N Sodhi,J E Davies

DOI: https://doi.org/10.1002/jbm.820290302

Abstract:Passivation of Ti6Al4V and cpTi implants using methods based on the ASTM-F86 nitric acid protocol are used with the intention of reducing their surface reactivity, and consequently the corrosion potential, in the highly corrosive biologic milieu. The ASTM-F86 passivation protocol was originally developed for surgical implants made of stainless steel and chrome cobalt alloy. Using X-ray photoelectron spectroscopy (XPS) to examine the effect of nitric acid passivation on the surface oxide layer of mill-annealed Ti6Al4V and cpTi, we have found that such treatment actually reduced the oxide thickness on the alloy while having no significant effect on the pure metal. These results correlated with observations obtained using graphite furnace atomic absorption spectrophotometry (GFAAS) to detect trace element release from solid, mill-annealed, Ti6Al4V and cpTi into serum-containing culture medium. We detected significantly greater levels of Ti, Al, and V in the presence of passivated compared to nonpassivated Ti6Al4V. In contrast, nitric acid passivation did not influence Ti release from mill-annealed cpTi. These results, derived from two mill-annealed Ti-based metals, would indicate that re-examination of ASTM-F86-based passivation protocols with respect to Ti6Al4V should be considered in view of the widespread use of this alloy for biomedical devices.