Prediction of Winter Wheat Yield Based on Remote Sensing with Accumulated Temperature

Cheng Yanlin
Abstract:Accumulated temperature is an important factor affecting crop growth and yield.This study aims to explore the use of accumulated temperature information to improve the accuracy of yield prediction.The field experiment data was collected in two winter wheat growing seasons during 2009-2010 and 2012-2013.The days of Growing Degree Days(GDD)that greater than zero and Cumulative Growing Degree Days(CGDD)and the NDVI were obtained and calculated by the measured ground spectral data and meteorological data.IN-Season Estimate of Yield(INSEY)and IN-Season Estimate of Yield-Cumulative Growing Degree Days(INSEY-CGDD)were introduced by GDD and CGDD divided by NDVI,respectively.Finally,NDVI,INSEY and INSEY-CGDD were utilized to build the estimation model with measured yield,respectively,and then the accuracy of the three types of yield estimation models were compared with each other.The result showed that all three kinds of variablesand the measured yield appeared exponential relationship.The accuracy of INSEY-CGDD model was the highest(R2=0.59).In other words,its ability of prediction was the optimal.The followed was the INSEY model(R2=0.55).However,the lowest accuracy was NDVI(R2=0.35).The studies showed that the accuracy of yield estimation model with remote sensing was improved effectively by the introduction of the effective temperature in winter wheat yield estimation model as an adjustment parameter.Simultaneously,a new strategy for a wide range of crop yield estimation was putted forward as well.
Environmental Science,Mathematics,Agricultural and Food Sciences
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