Growth of high quality KADP mixed crystals grown by conventional and sankaranayanan-ramasamy (SR) methods for nonlinear optical applications

T.S. Franklin Rajesh,S. Sahaya Jude Dhas,A. Steephenraj,R. Senthamizhselvi,Sivakumar Aswathappa,Raju Suresh Kumar,Abdulrahman I. Almansour
DOI: https://doi.org/10.1016/j.optmat.2024.115058
IF: 3.754
2024-02-16
Optical Materials
Abstract:Transparent KDP: ADP - 85:15 mixed crystals of enhanced size were grown by employing the conventional slow evaporation (C-KADP) as well as the Sankaranarayanan–Ramasamy (SR-KADP) method. High-resolution X-ray diffraction (HRXRD) analysis establishes a good crystalline quality for the SR-KADP crystal with a full width at the half maximum of 8 arc sec. The UV–Vis study shows an improved transmittance for the SR-KADP mixed crystal compared to the C-KADP mixed crystals. Less dislocation density and comparatively lower etch pits observed from the chemical etching study disclose a better quality of SR-KADP crystal over the C-KADP crystal. Photoconductivity analysis confirms a positive photo-conducting property for both the grown crystals. The observed two-fold increase in the value of d 33 (piezoelectric coefficient) for the SR-KADP crystal (4Pc/N) reveals an improved piezoelectric property. The laser damage threshold (LDT) of the SR-KADP crystal is 10.00 GW/cm 2 which declares the evidence for the higher damage threshold value compared to the C-KADP crystal (7.50 GW/cm 2 ).
materials science, multidisciplinary,optics
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